John F Stover: search on Z-Library

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1

Handbook of Vitamins, Fifth Edition || Riboflavin (Vitamin B2)

Zempleni, Janos, Suttie, John, III, Jesse, Stover, Patrick

Year:

2013

Language:

english

File:

PDF, 1.38 MB

english, 2013

2

How Increased Contraceptive Use has Reduced Maternal Mortality

John Stover, John Ross

Journal:

Maternal and Child Health Journal

Year:

2010

Language:

english

File:

PDF, 381 KB

english, 2010

3

Harmonizing Methods for Estimating the Impact of Contraceptive Use on Unintended Pregnancy, Abortion, and Maternal Health

Askew, Ian, Weinberger, Michelle, Dasgupta, Aisha, Darroch, Jacqueline, Smith, Ellen, Stover, John, Yahner, Melanie

Journal:

Global Health: Science and Practice

Year:

2017

Language:

english

File:

PDF, 639 KB

english, 2017

4

Practical aspects of batch RO design for energy-efficient seawater desalination

Swaminathan, Jaichander, Tow, Emily W., Stover, Richard L., Lienhard, John H.

Journal:

Year:

2019

Language:

english

File:

PDF, 3.85 MB

english, 2019

5

When Pan Met Wendy: Gendered Membership Debates Among the Radical Faeries

John A. Stover III

Journal:

Nova Religio The Journal of Alternative and Emergent Religions

Year:

2008

Language:

english

File:

PDF, 145 KB

english, 2008

6

SPIE Proceedings [SPIE SPIE Optical Systems Design - Jena, Germany (Monday 7 September 2015)] Optical Systems Design 2015: Illumination Optics IV - A cross-polarized freeform illumination design for glare reduction in fruit quality inspection

Kidger, Tina E., David, Stuart, Keresztes, Janos C., Koshel, R. John, Chipman, Russel, Stover, John C., Saeys, Wouter

Year:

2015

Language:

english

File:

PDF, 1.50 MB

english, 2015

7

Levels and trends in contraceptive prevalence, unmet need, and demand for family planning for 29 states and union territories in India: a modelling study using the Family Planning Estimation Tool

New, Jin Rou, Cahill, Niamh, Stover, John, Gupta, Yogender Pal, Alkema, Leontine

Journal:

The Lancet Global Health

Year:

2017

Language:

english

File:

PDF, 4.50 MB

english, 2017

8

SPIE Proceedings [SPIE Optoelectronics and High-Power Lasers & Applications - San Jose, CA (Saturday 24 January 1998)] Flatness, Roughness, and Discrete Defects Characterization for Computer Disks, Wafers, and Flat Panel Displays II - Characteristics of a high-resolution displacement sensor using mode interference in the optical waveguide

Iwasaki, Yutaka, Doi, Masaaki, Shionoya, Takashi, Okamoto, Kazuya, Stover, John C.

Year:

1998

Language:

english

File:

PDF, 3.19 MB

english, 1998

9

SPIE Proceedings [SPIE San Diego, '91, San Diego, CA - San Diego, CA (Sunday 21 July 1991)] Optical Scatter: Applications, Measurement, and Theory - Bidirectional reflectance distribution function raster scan technique for curved samples

McIntosh, Malcolm B., McNeely, Joseph R., Stover, John C.

Year:

1991

Language:

english

File:

PDF, 652 KB

english, 1991

10

Calculation Of Surface Statistics From Light Scatter

Stover, John C.

Journal:

Optical Engineering

Year:

1984

Language:

english

File:

PDF, 369 KB

english, 1984

11

SPIE Proceedings [SPIE Optoelectronics and High-Power Lasers & Applications - San Jose, CA (Saturday 24 January 1998)] Flatness, Roughness, and Discrete Defects Characterization for Computer Disks, Wafers, and Flat Panel Displays II - Statistical process control by employing circular and spherical statistics for the interpretation of BRDF measurements

Rothe, Hendrik, Hueser, Dorothee, Kasper, Andre, Stover, John C.

Year:

1998

Language:

english

File:

PDF, 1.23 MB

english, 1998

12

SPIE Proceedings [SPIE Optoelectronics and High-Power Lasers & Applications - San Jose, CA (Saturday 24 January 1998)] Flatness, Roughness, and Discrete Defects Characterization for Computer Disks, Wafers, and Flat Panel Displays II - Round robin determination of power spectral densities of different Si wafer surfaces

Marx, Egon, Malik, Igor J., Strausser, Yale E., Bristow, Thomas C., Poduje, Noel S., Stover, John C., Stover, John C.

Year:

1998

Language:

english

File:

PDF, 644 KB

english, 1998

13

SPIE Proceedings [SPIE Optoelectronics '99 - Integrated Optoelectronic Devices - San Jose, CA (Saturday 23 January 1999)] Surface Characterization for Computer Disks, Wafers, and Flat Panel Displays - Cross-linking thin film characterization technique for data storage, semiconductor, and flat panel display devices

Bloomer, Iris, Harrison, Dale A., Prakash, Shiva, Zhang, Kai, Lian, Sean, Stover, John C.

Year:

1999

Language:

english

File:

PDF, 1016 KB

english, 1999

14

SPIE Proceedings [SPIE 31st Annual Technical Symposium - San Diego, CA, United States (Sunday 17 August 1986)] Current Developments in Optical Engineering II - Wavelength Scaling Of BRDF Scatter Data

Stover, John C., Gillespie, Calvin H., Cady, Fredrick M., Cheever, Daniel R., Klicker, Kyle A.

Year:

1986

Language:

english

File:

PDF, 257 KB

english, 1986

15

SPIE Proceedings [SPIE Optoelectronics '99 - Integrated Optoelectronic Devices - San Jose, CA (Saturday 23 January 1999)] Surface Characterization for Computer Disks, Wafers, and Flat Panel Displays - Modeled and measured scatter from vias

Stover, John C., Scheer, Craig A., Ivakhnenko, Vladimir I., Eremin, Yuri A., Grishina, Natalia, Stover, John C.

Year:

1999

Language:

english

File:

PDF, 797 KB

english, 1999

16

SPIE Proceedings [SPIE Optoelectronics '99 - Integrated Optoelectronic Devices - San Jose, CA (Saturday 23 January 1999)] Surface Characterization for Computer Disks, Wafers, and Flat Panel Displays - TIS, AFM, interferometry, and optical profiler correlation of surface roughness on silicon wafers

Taylor, Patrick A., Dawson, Dean J., Stover, John C.

Year:

1999

Language:

english

File:

PDF, 856 KB

english, 1999

17

SPIE Proceedings [SPIE 1986 Microlithography Conferences - Santa Clara (Monday 10 March 1986)] Optical Microlithography V - Overview Of Dry-Etch Techniques

Salzer, John M., Stover, Harry L.

Year:

1986

Language:

english

File:

PDF, 207 KB

english, 1986

18

SPIE Proceedings [SPIE 32nd Annual Technical Symposium - San Diego, CA (Monday 15 August 1988)] Applications of Digital Image Processing XI - System Design For A Dental Image Processing System

Cady, Fredrick M., Stover, John C., Senecal, William J., Tescher, Andrew G.

Year:

1988

Language:

english

File:

PDF, 3.76 MB

english, 1988

19

SPIE Proceedings [SPIE San Diego, '91, San Diego, CA - San Diego, CA (Sunday 21 July 1991)] Optical Scatter: Applications, Measurement, and Theory - Optimal estimation of finish parameters

Church, Eugene L., Takacs, Peter Z., Stover, John C.

Year:

1991

Language:

english

File:

PDF, 896 KB

english, 1991

20

SPIE Proceedings [SPIE Optoelectronics and High-Power Lasers & Applications - San Jose, CA (Saturday 24 January 1998)] Flatness, Roughness, and Discrete Defects Characterization for Computer Disks, Wafers, and Flat Panel Displays II - Comparison of models and measurements of scatter from surface-bound particles

Scheer, Craig A., Stover, John C., Ivakhnenko, Vladimir I., Stover, John C.

Year:

1998

Language:

english

File:

PDF, 2.39 MB

english, 1998

21

Financing transformative health systems towards achievement of the health Sustainable Development Goals: a model for projected resource needs in 67 low-income and middle-income countries

Stenberg, Karin, Hanssen, Odd, Edejer, Tessa Tan-Torres, Bertram, Melanie, Brindley, Callum, Meshreky, Andreia, Rosen, James E, Stover, John, Verboom, Paul, Sanders, Rachel, Soucat, Agnès

Journal:

The Lancet Global Health

Year:

2017

Language:

english

File:

PDF, 756 KB

english, 2017

22

Towards an improved investment approach for an effective response to HIV/AIDS

Bernhard Schwartländer, John Stover, Timothy Hallett, Rifat Atun, Carlos Avila, Eleanor Gouws, Michael Bartos, Peter D Ghys, Marjorie Opuni, David Barr, Ramzi Alsallaq, Lori Bollinger, Marcelo de Frei

Journal:

Year:

2011

Language:

english

File:

PDF, 388 KB

english, 2011

23

Updates to the Spectrum model to estimate key HIV indicators for adults and children

Stover, John, Andreev, Kirill, Slaymaker, Emma, Gopalappa, Chaitra, Sabin, Keith, Velasquez, Claudia, Nakiyingi-Miiro, Jessica, Crampin, Amelia, Lutalo, Tom, Herbst, Kobus, Gregson, Simon, Urassa, Mar

Journal:

Year:

2014

Language:

english

File:

PDF, 506 KB

english, 2014

24

SPIE Proceedings [SPIE SPIE Optical Systems Design - Jena, Germany (Monday 7 September 2015)] Optical Systems Design 2015: Optical Fabrication, Testing, and Metrology V - Measuring and quantifying scatter from a variety of sample types

Duparré, Angela, Geyl, Roland, Stover, John C.

Year:

2015

Language:

english

File:

PDF, 265 KB

english, 2015

25

SPIE Proceedings [SPIE Optoelectronics and High-Power Lasers & Applications - San Jose, CA (Saturday 24 January 1998)] Flatness, Roughness, and Discrete Defects Characterization for Computer Disks, Wafers, and Flat Panel Displays II - New software algorithm of 3D surface profile measurement based on phase-shift interfering technology

Liu, Bo, Fan, Jianying, Yang, Ling, Wang, Qi-Shan, Stover, John C.

Year:

1998

Language:

english

File:

PDF, 700 KB

english, 1998

26

SPIE Proceedings [SPIE SPIE's 1996 International Symposium on Optical Science, Engineering, and Instrumentation - Denver, CO (Sunday 4 August 1996)] Flatness, Roughness, and Discrete Defect Characterization for Computer Disks, Wafers, and Flat Panel Displays - Confocal microscope 3D visualizing method for fine surface characterization of microstructures

Ichikawa, Yoshiharu, Toriwaki, Jun-ichiro, Stover, John C.

Year:

1996

Language:

english

File:

PDF, 527 KB

english, 1996

27

SPIE Proceedings [SPIE Applications in Optical Science and Engineering - Boston, MA (Sunday 15 November 1992)] Industrial Applications of Optical Inspection, Metrology, and Sensing - Design review of a unique camera-aided positioning system

Rudberg, Donald A., Stover, John C., Southwood, Mark E., Bjork, Donald R., Brown, Gordon M., Harding, Kevin G., Stahl, H. Philip

Year:

1993

Language:

english

File:

PDF, 363 KB

english, 1993

28

SPIE Proceedings [SPIE SPIE/COS Photonics Asia - Beijing, China (Thursday 9 October 2014)] Optical Metrology and Inspection for Industrial Applications III - The art of specifying surface quality

Han, Sen, Yoshizawa, Toru, Zhang, Song, Stover, John, Han, Sen

Year:

2014

Language:

english

File:

PDF, 279 KB

english, 2014

29

Bioavailability of capsaicin and its implications for drug delivery

Rollyson, William D., Stover, Cody A., Brown, Kathleen C., Perry, Haley E., Stevenson, Cathryn D., McNees, Christopher A., Ball, John G., Valentovic, Monica A., Dasgupta, Piyali

Journal:

Journal of Controlled Release

Year:

2014

Language:

english

File:

PDF, 546 KB

english, 2014

30

Defeating AIDS—advancing global health

Piot, Peter, Abdool Karim, Salim S, Hecht, Robert, Legido-Quigley, Helena, Buse, Kent, Stover, John, Resch, Stephen, Ryckman, Theresa, Møgedal, Sigrun, Dybul, Mark, Goosby, Eric, Watts, Charlotte, Kil

Journal:

Year:

2015

Language:

english

File:

PDF, 2.56 MB

english, 2015

31

How Increased Contraceptive Use has Reduced Maternal Mortality

John Stover, John Ross

Journal:

Maternal and Child Health Journal

Year:

2014

Language:

english

File:

PDF, 88 KB

english, 2014

32

Russell Sage: The Money King. By Paul Sarnoff. New York, Ivan Obolensky, Inc., 1965. Pp. 398. $6.95.

Stover, John F.

Journal:

The Business History Review

Year:

1966

Language:

english

File:

PDF, 208 KB

english, 1966

33

Henry Varnum Poor: Business Editor, Analyst, and Reformerby Alfred D. Chandler

Review by: John F. Stover

Journal:

Indiana Magazine of History

Year:

1957

Language:

english

File:

PDF, 375 KB

english, 1957

34

Mild Cervical Spine Trauma Showing Symptomatic Calcified Cervical Disc Herniation in a Child

Schaser, Klaus-D., Stover, John F., Kaeaeb, Max J., Haas, N. P., Mittlmeier, Thomas

Journal:

Year:

2003

Language:

english

File:

PDF, 265 KB

english, 2003

35

Health benefits, costs, and cost-effectiveness of earlier eligibility for adult antiretroviral therapy and expanded treatment coverage: a combined analysis of 12 mathematical models

Eaton, Jeffrey W, Menzies, Nicolas A, Stover, John, Cambiano, Valentina, Chindelevitch, Leonid, Cori, Anne, Hontelez, Jan A C, Humair, Salal, Kerr, Cliff C, Klein, Daniel J, Mishra, Sharmistha, Mitche

Journal:

The Lancet Global Health

Year:

2014

Language:

english

File:

PDF, 594 KB

english, 2014

36

SPIE Proceedings [SPIE Critical Review Collection - Bellingham, United States (Friday 13 January 2017)] Optical Metrology: A Critical Review - Optical scatter measurements and their application to surface metrology

Stover, John C.

Year:

2017

Language:

english

File:

PDF, 977 KB

english, 2017

37

Global consequences of improving productivity

Theodore J. Gordon, John Stover

Journal:

Technological Forecasting and Social Change

Year:

1983

Language:

english

File:

PDF, 1.04 MB

english, 1983

38

SPIE Proceedings [SPIE 31st Annual Technical Symposium - San Diego, CA, United States (Sunday 17 August 1986)] Current Developments in Optical Engineering II - Design Review Of A Unique Complete Angle Scatter Instrument (CASI)

Cheever, Daniel R., Cad, Fredrick M., Klicker, Kyle A., Stover, John C.

Year:

1986

Language:

english

File:

PDF, 435 KB

english, 1986

39

Modeling scatter from silicon wafer features based on discrete sources method

Stover, John C.

Journal:

Optical Engineering

Year:

1999

Language:

english

File:

PDF, 195 KB

english, 1999

40

SPIE Proceedings [SPIE 33rd Annual Techincal Symposium - San Diego (Monday 7 August 1989)] Scatter from Optical Components - Bidirectional Reflectance Distribution Function (BRDF) Measurements On Multilayer Dielectric Coatings As A Function Of Polarization State

Schroeder, M. J., Musinski, D. J., Hull-Allen, C. G., Van Milligen, F. J., Stover, John C.

Year:

1990

Language:

english

File:

PDF, 409 KB

english, 1990

41

SPIE Proceedings [SPIE Optoelectronics '99 - Integrated Optoelectronic Devices - San Jose, CA (Saturday 23 January 1999)] Surface Characterization for Computer Disks, Wafers, and Flat Panel Displays - Measurements of thin film disks by surface reflectance analysis

Klein, David, Vurens, Gerard H., Stover, John C.

Year:

1999

Language:

english

File:

PDF, 3.73 MB

english, 1999

42

Surface Roughness Measurements Of Curved Surfaces By Light Scatter

Stover, John C.

Journal:

Optical Engineering

Year:

1982

Language:

english

File:

PDF, 216 KB

english, 1982

43

SPIE Proceedings [SPIE 33rd Annual Techincal Symposium - San Diego (Monday 7 August 1989)] Scatter from Optical Components - Power Spectrum Standard For Surface Roughness: Part I

Janeczko, D. J., Stover, John C.

Year:

1990

Language:

english

File:

PDF, 548 KB

english, 1990

44

SPIE Proceedings [SPIE Optoelectronics and High-Power Lasers & Applications - San Jose, CA (Saturday 24 January 1998)] Flatness, Roughness, and Discrete Defects Characterization for Computer Disks, Wafers, and Flat Panel Displays II - Use of new technology for enhanced detection of crystalline defects on silicon wafers

Dou, Lie, Kesler, Daniel, Grose, Richard, Stover, John C.

Year:

1998

Language:

english

File:

PDF, 2.02 MB

english, 1998

45

SPIE Proceedings [SPIE 27th Annual Techincal Symposium - San Diego (Tuesday 23 August 1983)] Precision Surface Metrology - Calculation Of Surface Statistics From Light Scatter

Stover, John C., Serati, Steven A., Gillespie, Calvin H., Wyant, James C.

Year:

1983

Language:

english

File:

PDF, 335 KB

english, 1983

46

SPIE Proceedings [SPIE 33rd Annual Techincal Symposium - San Diego (Monday 7 August 1989)] Scatter from Optical Components - 45°/0° Bidirectional Reflectance Distribution Function Standard Development

Barnes, P. Y., Hsia, Jack J., Stover, John C.

Year:

1990

Language:

english

File:

PDF, 332 KB

english, 1990

47

Family Planning Programs in 2004: New Assessments in a Changing Environment

John Ross, John Stover and Demi Adelaja

Journal:

International Family Planning Perspectives

Year:

2007

Language:

english

File:

PDF, 1.97 MB

english, 2007

48

Lessons from Botswana's HIV/AIDS treatment programme

Journal:

The Lancet Global Health

Year:

2014

Language:

english

File:

PDF, 32 KB

english, 2014

49

Noninvasive cardiac output and blood pressure monitoring cannot replace an invasive monitoring system in critically ill patients

John F Stover, Reto Stocker, Renato Lenherr, Thomas A Neff, Silvia R Cottini, Bernhard Zoller, Markus Béchir

Journal:

BMC Anesthesiology

Year:

2009

Language:

english

File:

PDF, 186 KB

english, 2009

50

Linking high parity and maternal and child mortality: what is the impact of lower health services coverage among higher order births?

Emily Sonneveldt,Willyanne DeCormier Plosky,John Stover

Journal:

BMC Public Health

Year:

2013

Language:

english

File:

PDF, 490 KB

english, 2013

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